Submitted by daveweiss on Tue, 08/23/2011 - 16:26
| Title | Study of methods to detect aberrant response patterns in computerized testing |
| Publication Type | Conference Paper |
| Year of Publication | 1999 |
| Authors | Iwamoto, CK, Nungester, RJ, Luecht, RM |
| Conference Name | Paper presented at the annual meeting of the National Council on Measurement in Education |
| Conference Location | Montreal, Canada |