Chen, S., Ankenmann, R. D., & Spray, J. A.. (1999). Exploring the relationship between item exposure rate and test overlap rate in computerized adaptive testing. Paper presented at the annual meeting of the National Council on Measurement in Education, Montreal, Canada.

Chen, S. - Y., Ankenmann, R. D., & Spray, J. A.. (1999). Exploring the relationship between item exposure rate and test overlap rate in computerized adaptive testing (ACT Research Report series 99-5). Iowa City IA: ACT, Inc.

Chen, S. - Y., Ankenmann, R. D., & Chang, H. - H.. (2000). A comparison of item selection rules at the early stages of computerized adaptive testing. Applied Psychological Measurement, 24, 241-255.

Chen, S. Y., Ankenmann, R. D., & Chang, H. - H.. (2000). A comparison of item selection rules at the early stages of computerized adaptive testing. Applied Psychological Measurement, 24, 241-255.

Chen, S. - Y., Ankenmann, R. D., & Spray, J. A.. (2003). The relationship between item exposure and test overlap in computerized adaptive testing. Journal of Educational Measurement, 40, 129-145.

Chen, S., Ankenmann, R. D., & Spray, J. A.. (2003). The relationship between item exposure and test overlap in computerized adaptive testing. Journal of Educational Measurement, 40, 129-145.

Chen, S., Ankenmann, R. D., & Spray, J. A.. (2003). The relationship between item exposure and test overlap in computerized adaptive testing. Journal of Educational Measurement, 40, 129-145.

Chen, S. - Y., & Ankenmann, R. D.. (2004). Effects of practical constraints on item selection rules at the early stages of computerized adaptive testing. Journal of Educational Measurement, 41, 149-174.

Chen, Y. - Y., & Ankenmann, R. D.. (2004). ffects of practical constraints on item selection rules at the early stages of computerized adaptive testing. Journal of Educational Measurement, 41, 149-174.