Export 10 results:
Filters: Author is Davey, T.  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
D
Davey, T., & Fan, M.. (2000). Specific information item selection for adaptive testing. In Paper presented at the annual meeting of the National Council on Measurement in Education. New Orleans.
Davey, T., & Nering, M. L.. (1998). Evaluating and insuring measurement precision in adaptive testing. In Paper presented at the annual meeting of the Psychometric Society. Urbana, IL.
Davey, T., & Nering, M. L.. (1998). Controlling item exposure and maintaining item security. In Paper presented at an Educational Testing Service-sponsored colloquium entitled “Computer-based testing: Building the foundations for future assessments. ” Philadelphia PA.
Davey, T., Nering, M., & Thompson, T.. (1997). Realistic simulation procedures for item response data. In In T. Miller (Chair), High-dimensional simulation of item response data for CAT research. Psychometric Society. Gatlinburg TN.
Davey, T., & Parshall, C. G.. (1995). New algorithms for item selection and exposure control with computerized adaptive testing. In Paper presented at the annual meeting of the American Educational Research Association. San Francisco CA.
Davey, T., Pommerich, M., & Thompson, D. T.. (1999). Pretesting alongside an operational CAT. In Paper presented at the annual meeting of the National Council on Measurement in Education. Montreal, Canada.
Davey, T., & Thomas, L.. (1996). Constructing adaptive tests to parallel conventional programs. In Paper presented at the annual meeting of the American Educational Research Association. New York.
Davey, T., & Nering, M.. (2002). Controlling item exposure and maintaining item security. In . C. N. Mills, M. T. Potenza, and J. J. Fremer (Eds.), Computer-Based Testing: Building the Foundation for Future Assessments (pp. 165-191). Mahwah, NJ: Lawrence Erlbaum Associates, Inc.
Davey, T., & Pitoniak, M. J.. (2006). Designing computerized adaptive tests. In . S.M. Downing and T. M. Haladyna (Eds.), Handbook of test development. New Jersey: Lawrence Erlbaum Associates.