Export 4 results:
Filters: First Letter Of Title is S and Author is Luecht, RM  [Clear All Filters]
1999
Iwamoto, C. K., Nungester, R. J., & Luecht, R. M.. (1999). Study of methods to detect aberrant response patterns in computerized testing. In Paper presented at the annual meeting of the National Council on Measurement in Education. Montreal, Canada.