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Chen, S. - Y., & Lei, P. - W.. (2005). Controlling Item Exposure and Test Overlap in Computerized Adaptive Testing. Applied Psychological Measurement, 29, 204-217. doi:10.1177/0146621604271495
Chen, S. - Y. (2010). A Procedure for Controlling General Test Overlap in Computerized Adaptive Testing. Applied Psychological Measurement, 34, 393-409. doi:10.1177/0146621610367788
Chen, S. - Y., Lei, P. - W., Chen, J. - H., & Liu, T. - C.. (2014). General Test Overlap Control: Improved Algorithm for CAT and CCT. Applied Psychological Measurement, 38, 229-244. doi:10.1177/0146621613513494