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Chen, S. Y., & Lei, P. W.. (2005). Controlling item exposure and test overlap in computerized adaptive testing. Applied Psychological Measurement, 29(2), 204–217.

Chen, S. - Y., Lei, P. W., & Liao, W. H.. (2008). Controlling item exposure and test overlap on the fly in computerized adaptive testing. British Journal of Mathematical and Statistical Psychology, 61, 471-92. presented at the Nov.