TY - CONF T1 - The Rasch model and missing data, with an emphasis on tailoring test items T2 - annual meeting of the American Educational Research Association Y1 - 1988 A1 - de Gruijter, D. N. M. AB - Many applications of educational testing have a missing data aspect (MDA). This MDA is perhaps most pronounced in item banking, where each examinee responds to a different subtest of items from a large item pool and where both person and item parameter estimates are needed. The Rasch model is emphasized, and its non-parametric counterpart (the Mokken scale) is considered. The possibility of tailoring test items in combination with their estimation is discussed; however, most methods for the estimation of item parameters are inadequate under tailoring. Without special measures, only marginal maximum likelihood produces adequate item parameter estimates under item tailoring. Fischer's approximate minimum-chi-square method for estimation of item parameters for the Rasch model is discussed, which efficiently produces item parameters. (TJH) JF - annual meeting of the American Educational Research Association CY - New Orleans, LA. USA ER - TY - ABST T1 - A two-stage testing procedure (Memorandum 403-77) Y1 - 1977 A1 - de Gruijter, D. N. M. CY - University of Leyden, The Netherlands, Educational Research Center ER -