TY - JOUR T1 - An Introduction to Multistage Testing JF - Applied Measurement in Education Y1 - 2006 A1 - Alan D Mead VL - 19 UR - http://www.tandfonline.com/doi/abs/10.1207/s15324818ame1903_1 ER - TY - CONF T1 - A sequential Bayesian procedure for item calibration in multistage testing T2 - Paper presented at the annual meeting of the National Council on Measurement in Education Y1 - 2004 A1 - van der Linden, W. J. A1 - Alan D Mead JF - Paper presented at the annual meeting of the National Council on Measurement in Education CY - San Diego CA ER - TY - ABST T1 - A sequential Bayes procedure for item calibration in multi-stage testing Y1 - 2003 A1 - van der Linden, W. J. A1 - Alan D Mead CY - Manuscript in preparation ER -