TY - RPRT T1 - The use of person-fit statistics in computerized adaptive testing Y1 - 2005 A1 - Meijer, R. R. A1 - van Krimpen-Stoop, E. M. L. A. JF - LSAC Research Report Series PB - Law School Administration Council CY - Newton, PA. USA SN - Computerized Testing Report 97-14 ER - TY - JOUR T1 - Using response times to detect aberrant responses in computerized adaptive testing JF - Psychometrika Y1 - 2003 A1 - van der Linden, W. J. A1 - van Krimpen-Stoop, E. M. L. A. KW - Adaptive Testing KW - Behavior KW - Computer Assisted Testing KW - computerized adaptive testing KW - Models KW - person Fit KW - Prediction KW - Reaction Time AB - A lognormal model for response times is used to check response times for aberrances in examinee behavior on computerized adaptive tests. Both classical procedures and Bayesian posterior predictive checks are presented. For a fixed examinee, responses and response times are independent; checks based on response times offer thus information independent of the results of checks on response patterns. Empirical examples of the use of classical and Bayesian checks for detecting two different types of aberrances in response times are presented. The detection rates for the Bayesian checks outperformed those for the classical checks, but at the cost of higher false-alarm rates. A guideline for the choice between the two types of checks is offered. VL - 68 ER - TY - CONF T1 - Using response times to detect aberrant behavior in computerized adaptive testing T2 - Paper presented at the annual meeting of the National Council on Measurement in Education Y1 - 2001 A1 - van der Linden, W. J. A1 - van Krimpen-Stoop, E. M. L. A. JF - Paper presented at the annual meeting of the National Council on Measurement in Education CY - Seattle WA ER - TY - ABST T1 - Using response times to detect aberrant behavior in computerized adaptive testing (Research Report 00-09) Y1 - 2000 A1 - van der Linden, W. J. A1 - van Krimpen-Stoop, E. M. L. A. CY - Enschede, The Netherlands: University of Twente, Faculty of Educational Science and Technology, Department of Measurement and Data Analysis ER -