TY - CONF T1 - Study of methods to detect aberrant response patterns in computerized testing T2 - Paper presented at the annual meeting of the National Council on Measurement in Education Y1 - 1999 A1 - Iwamoto, C. K. A1 - Nungester, R. J. A1 - Luecht, RM JF - Paper presented at the annual meeting of the National Council on Measurement in Education CY - Montreal, Canada ER -