TY - CONF T1 - Predicting item exposure parameters in computerized adaptive testing T2 - Paper presented at the annual meeting of the American Educational Research Association Y1 - 2003 A1 - Chen, S-Y. A1 - Doong, H. JF - Paper presented at the annual meeting of the American Educational Research Association CY - Chicago IL N1 - {PDF file, 239 KB} ER -