01482nas a2200145 4500008003900000245006500039210006500104300001200169490000700181520102700188100002001215700002501235700002301260856005301283 2006 d00aOptimal Testlet Pool Assembly for Multistage Testing Designs0 aOptimal Testlet Pool Assembly for Multistage Testing Designs a204-2150 v303 a
Computerized multistage testing (MST) designs require sets of test questions (testlets) to be assembled to meet strict, often competing criteria. Rules that govern testlet assembly may dictate the number of questions on a particular subject or may describe desirable statistical properties for the test, such as measurement precision. In an MST design, testlets of differing difficulty levels must be created. Statistical properties for assembly of the testlets can be expressed using item response theory (IRT) parameters. The testlet test information function (TIF) value can be maximized at a specific point on the IRT ability scale. In practical MST designs, parallel versions of testlets are needed, so sets of testlets with equivalent properties are built according to equivalent specifications. In this project, the authors study the use of a mathematical programming technique to simultaneously assemble testlets to ensure equivalence and fairness to candidates who may be administered different testlets.
1 aAriel, Adelaide1 aVeldkamp, Bernard, P1 aBreithaupt, Krista uhttp://apm.sagepub.com/content/30/3/204.abstract00443nas a2200133 4500008003900000245005900039210005900098300001200157490000600169100002300175700002000198700002500218856006600243 2005 d00aAutomated Simultaneous Assembly for Multistage Testing0 aAutomated Simultaneous Assembly for Multistage Testing a319-3300 v51 aBreithaupt, Krista1 aAriel, Adelaide1 aVeldkamp, Bernard, P uhttp://www.tandfonline.com/doi/abs/10.1207/s15327574ijt0503_8