01281nas a2200133   4500008003900000245009500039210006900134300001200203490000700215520083800222100001801060700001601078856005301094       2012                          d00aA Stochastic Method for Balancing Item Exposure Rates in Computerized Classification Tests0 aStochastic Method for Balancing Item Exposure Rates in Computeri  a181-1880 v363 a<p>Computerized classification tests (CCTs) classify examinees into categories such as pass/fail, master/nonmaster, and so on. This article proposes the use of stochastic methods from sequential analysis to address item overexposure, a practical concern in operational CCTs. Item overexposure is traditionally dealt with in CCTs by the Sympson-Hetter (SH) method, but this method is unable to restrict the exposure of the most informative items to the desired level. The authors&rsquo; new method of stochastic item exposure balance (SIEB) works in conjunction with the SH method and is shown to greatly reduce the number of overexposed items in a pool and improve overall exposure balance while maintaining classification accuracy comparable with using the SH method alone. The method is demonstrated using a simulation study.</p>
1 aHuebner, Alan1 aLi, Zhushan  uhttp://apm.sagepub.com/content/36/3/181.abstract