@conference {99, title = {The Rasch model and missing data, with an emphasis on tailoring test items}, booktitle = {annual meeting of the American Educational Research Association}, year = {1988}, month = {April 5-9}, address = {New Orleans, LA. USA}, abstract = {Many applications of educational testing have a missing data aspect (MDA). This MDA is perhaps most pronounced in item banking, where each examinee responds to a different subtest of items from a large item pool and where both person and item parameter estimates are needed. The Rasch model is emphasized, and its non-parametric counterpart (the Mokken scale) is considered. The possibility of tailoring test items in combination with their estimation is discussed; however, most methods for the estimation of item parameters are inadequate under tailoring. Without special measures, only marginal maximum likelihood produces adequate item parameter estimates under item tailoring. Fischer{\textquoteright}s approximate minimum-chi-square method for estimation of item parameters for the Rasch model is discussed, which efficiently produces item parameters. (TJH)}, author = {de Gruijter, D. N. M.} } @booklet {1359, title = {A two-stage testing procedure (Memorandum 403-77)}, year = {1977}, address = {University of Leyden, The Netherlands, Educational Research Center}, author = {de Gruijter, D. N. M.} }